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News and events

New test sample for Piezoresponse Force Microscopy

New test sample for Piezoresponse Force Microscopy

Piezoelectric single crystal lead PMN-PT
28.04.2022
Probes with Full Diamond tips

Probes with Full Diamond tips

The best AFM tips for both routine and special measurements at the reasonable price!
Full diamond tip with curvature radius less than 10nm.
19.03.2018
Probes with Single Crystal Diamond Tip

Probes with Single Crystal Diamond Tip

Extension of product line - Super Sharp (2nm), Probes for Nanoindentation, probes for Electrical Measurement (7nm). The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
30.10.2016
Cantilevers with Single Crystal Diamond Tip

Cantilevers with Single Crystal Diamond Tip

TipsNano Company would like to announce a New Unique product - Probes with Single Crystal Diamond Tip for topography and electrical measurements. The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
31.07.2016
Personalized sets

Personalized sets

TipsNano starts to offer Personalized Sets of Cantilevers completed at customers' request.
12.04.2016
TiN coated conductive probes

TiN coated conductive probes

Conductive TiN coated probes are coming back to the product line. Probe series - FMG01, NSG01, NSG10, NSG30 - with hard and wear-resistant TiN coating are available for operating in any electrical AFM modes - C-AFM, PFM, EFM, KPFM, SSRM on polymers.
20.02.2016

Extension of HOPG product line

We extended HOPG product line and now four HOPG types (ZYA, ZYB, ZYD, ZYH) which differ by meaning of mosaic spread are available with sizes till 50x50mm. Both double-sided (DS) and single-sided (SS) HOPG pieces can be ordered.
10.01.2016

 

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