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Calibration

To determine the credibility of studies by AFM — microscopy testing and calibration of microscope work and test the quality of probes (scale of X-, Y-, Z - coordinates, the radius of the tip of the cantilever, linearity and orthogonality of the axes of the scan). For calibration and determination of the working shapes of the probes used special test structures with known topography. 
For the calibration of microscopes in the scanning plane and vertically apply a diffraction grating with submicron sizes. In the absence of a specially manufactured calibration gratings, can be used as a test object to obtain atomic resolution fresh cleaved mica or highly oriented pyrolytic graphite (HOPG), because the parameters of the terrain are well known. 
Advantages of graphite as the test sample are: stable operation is output; a low concentration of point and line defects; low reactivity in atmospheric conditions; the possibility of obtaining atomically clean surface.

TGS1F TGS1F

Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm, 1517±20nm.

  €250
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TGS1F TGS1F

Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm, 1517±20nm.

  €250
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TGS1_PTB TGS1_PTB

Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €600
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TGS1_PTB TGS1_PTB

Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €600
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TGSFull TGSFull

Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1,150
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TGSFull TGSFull

Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1,150
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TGS2 TGS2

Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €500
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TGS2 TGS2

Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €500
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TGS1 TGS1

Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €200
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TGS1 TGS1

Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €200
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Mica/15x15 Mica/15x15

Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm.

  €150
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Mica/15x15 Mica/15x15

Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm.

  €150
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DNA01 DNA01

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

  €150
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DNA01 DNA01

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

  €150
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TGS_Cert TGS_Cert

Set of AFM calibration standards with International Calibration Cetficates. Intended for lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €3,865
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TGS_Cert TGS_Cert

Set of AFM calibration standards with International Calibration Cetficates. Intended for lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €3,865
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Mica/d9.5 Mica/d9.5

Mica Disks, 0.15 mm (0.006")  thickness,  size  9.5 mm diameter.

  €150
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Mica/d9.5 Mica/d9.5

Mica Disks, 0.15 mm (0.006")  thickness,  size  9.5 mm diameter.

  €150
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SU001 SU001

Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.

  €239
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SU001 SU001

Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.

  €239
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SiC/0.75 SiC/0.75

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

  €150
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SiC/0.75 SiC/0.75

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

  €150
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SiC/1.5 SiC/1.5

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

  €150
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SiC/1.5 SiC/1.5

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

  €150
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TGG1 TGG1

Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.

  €200
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TGG1 TGG1

Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.

  €200
Аdd to cart
TGZ2 TGZ2

Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110±2nm.

  €100
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TGZ2 TGZ2

Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110±2nm.

  €100
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TGZ1 TGZ1

Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.

  €100
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TGZ1 TGZ1

Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.

  €100
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TGQ1 TGQ1

Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.

  €300
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TGQ1 TGQ1

Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.

  €300
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TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €300
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TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €300
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PFM03 PFM03

Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.

  €350
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PFM03 PFM03

Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.

  €350
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TGZ3 TGZ3

Calibration grating TGZ3 for Z and X (or Y) calibration. Step height 520±3nm.

  €100
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TGZ3 TGZ3

Calibration grating TGZ3 for Z and X (or Y) calibration. Step height 520±3nm.

  €100
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TGZ4 TGZ4

Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.

  €100
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TGZ4 TGZ4

Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.

  €100
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TGX1 TGX1

Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.

  €200
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TGX1 TGX1

Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.

  €200
Аdd to cart
TDG01 TDG01

Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.

  €300
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TDG01 TDG01

Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.

  €300
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