sales@tipsnano.com
more contacts
 

Calibration

To determine the credibility of studies by AFM — microscopy testing and calibration of microscope work and test the quality of probes (scale of X-, Y-, Z - coordinates, the radius of the tip of the cantilever, linearity and orthogonality of the axes of the scan). For calibration and determination of the working shapes of the probes used special test structures with known topography. 
For the calibration of microscopes in the scanning plane and vertically apply a diffraction grating with submicron sizes. In the absence of a specially manufactured calibration gratings, can be used as a test object to obtain atomic resolution fresh cleaved mica or highly oriented pyrolytic graphite (HOPG), because the parameters of the terrain are well known. 
Advantages of graphite as the test sample are: stable operation is output; a low concentration of point and line defects; low reactivity in atmospheric conditions; the possibility of obtaining atomically clean surface.

Mica/d9.5 Mica/d9.5

Mica Disks, 0.15 mm (0.006")  thickness,  size  9.5 mm diameter.

  €150
Аdd to cart
Mica/d9.5 Mica/d9.5

Mica Disks, 0.15 mm (0.006")  thickness,  size  9.5 mm diameter.

  €150
Аdd to cart
SU001 SU001

Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.

  €239
Аdd to cart
SU001 SU001

Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.

  €239
Аdd to cart
Mica/15x15 Mica/15x15

Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm.

  €150
Аdd to cart
Mica/15x15 Mica/15x15

Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm.

  €150
Аdd to cart
TGS1_PTB TGS1_PTB

Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €1 200
Аdd to cart
TGS1_PTB TGS1_PTB

Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €1 200
Аdd to cart
TGS1F TGS1F

Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm, 1517±20nm.

  €720
Аdd to cart
TGS1F TGS1F

Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm, 1517±20nm.

  €720
Аdd to cart
TGSFull TGSFull

Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 590
Аdd to cart
TGSFull TGSFull

Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 590
Аdd to cart
DNA01 DNA01

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

  €150
Аdd to cart
DNA01 DNA01

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

  €150
Аdd to cart
TGS2 TGS2

Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 290
Аdd to cart
TGS2 TGS2

Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 290
Аdd to cart
TGSFull+ TGSFull+

Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 840
Аdd to cart
TGSFull+ TGSFull+

Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 840
Аdd to cart
TGS1 TGS1

Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €420
Аdd to cart
TGS1 TGS1

Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €420
Аdd to cart
SiC/0.75 SiC/0.75

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

  €240
Аdd to cart
SiC/0.75 SiC/0.75

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

  €240
Аdd to cart
SiC/1.5 SiC/1.5

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

  €240
Аdd to cart
SiC/1.5 SiC/1.5

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

  €240
Аdd to cart
TGG1 TGG1

Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.

  €200
Аdd to cart
TGG1 TGG1

Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.

  €200
Аdd to cart
TGZ2 TGZ2

Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110 ± 2nm.

  €170
Аdd to cart
TGZ2 TGZ2

Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110 ± 2nm.

  €170
Аdd to cart
TGZ1 TGZ1

Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.

  €170
Аdd to cart
TGZ1 TGZ1

Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.

  €170
Аdd to cart
TGQ1 TGQ1

Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.

  €350
Аdd to cart
TGQ1 TGQ1

Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.

  €350
Аdd to cart
PFM03 PFM03

Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.

  €450
Аdd to cart
PFM03 PFM03

Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.

  €450
Аdd to cart
TGZ3 TGZ3

Calibration grating TGZ3 for Z and X (or Y) calibration. Step height 520±3nm.

  €170
Аdd to cart
TGZ3 TGZ3

Calibration grating TGZ3 for Z and X (or Y) calibration. Step height 520±3nm.

  €170
Аdd to cart
TGZ4 TGZ4

Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.

  €340
Аdd to cart
TGZ4 TGZ4

Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.

  €340
Аdd to cart
TDG01 TDG01

Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.

  €300
Аdd to cart
TDG01 TDG01

Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.

  €300
Аdd to cart
TGX1 TGX1

Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.

  €250
Аdd to cart
TGX1 TGX1

Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.

  €250
Аdd to cart
TGL1 TGL1

Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.

  €350
Аdd to cart
TGL1 TGL1

Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.

  €350
Аdd to cart
PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
Аdd to cart
PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
Аdd to cart
TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €350
Аdd to cart
TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €350
Аdd to cart

show more
 

successfully added to cart!

Continue shoppingGo to cart