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28.04.2022 New test sample for Piezoresponse Force Microscopy New test sample for Piezoresponse Force Microscopy
Piezoelectric single crystal lead PMN-PT
19.03.2018 Probes with Full Diamond tips Probes with Full Diamond tips
The best AFM tips for both routine and special measurements at the reasonable price!
Full diamond tip with curvature radius less than 10nm.
30.10.2016 Probes with Single Crystal Diamond Tip Probes with Single Crystal Diamond Tip
Extension of product line - Super Sharp (2nm), Probes for Nanoindentation, probes for Electrical Measurement (7nm). The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
All news  
NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
Аdd to cart
PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
Аdd to cart
NSG30/Pt NSG30/Pt

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.

from €420
Аdd to cart
NSG30/Pt NSG30/Pt

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.

from €420
Аdd to cart
NSG30 NSG30

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.

from €350
Аdd to cart
NSG30 NSG30

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.

from €350
Аdd to cart
MFM_LM MFM_LM

Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.

  €950
Аdd to cart
MFM_LM MFM_LM

Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.

  €950
Аdd to cart
MFM01 MFM01

High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.

  €690
Аdd to cart
MFM01 MFM01

High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.

  €690
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <5nm

  €1 215
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <5nm

  €1 215
Аdd to cart
CSG10_SS CSG10_SS

Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
CSG10_SS CSG10_SS

Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
FMG01_SS FMG01_SS

Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
FMG01_SS FMG01_SS

Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
DRP_In DRP_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.

  €1 125 €675
Аdd to cart
DRP_In DRP_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.

  €1 125 €675
Аdd to cart
FMG01/Pt FMG01/Pt

High Resolution Force Modulation Conductive Silicon AFM Cantilevers FMG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 45-115kHz, force constant 0.5 -9.5N/m.

from €420
Аdd to cart
FMG01/Pt FMG01/Pt

High Resolution Force Modulation Conductive Silicon AFM Cantilevers FMG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 45-115kHz, force constant 0.5 -9.5N/m.

from €420
Аdd to cart
DCP30 DCP30

Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.

  €750
Аdd to cart
DCP30 DCP30

Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.

  €750
Аdd to cart

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