News
28.04.2022
New test sample for Piezoresponse Force Microscopy Piezoelectric single crystal lead PMN-PT
19.03.2018
Probes with Full Diamond tipsThe best AFM tips for both routine and special measurements at the reasonable price! Full diamond tip with curvature radius less than 10nm.
30.10.2016
All news 
Probes with Single Crystal Diamond TipExtension of product line - Super Sharp (2nm), Probes for Nanoindentation, probes for Electrical Measurement (7nm). The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more! 
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PFM_S
Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.
€300
PFM_S
Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.
€300
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
€600
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
€600
NSG30/Pt
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.
from
€360
NSG30/Pt
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.
from
€360
NSG30
High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.
from
€300
NSG30
High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.
from
€300
MFM_LM
Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.
€870
MFM_LM
Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.
€870
MFM01
High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.
from
€600
MFM01
High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.
from
€600
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).
€1 215
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).
€1 215
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€600
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€600
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.
€600
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.
€600
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.
€1 125
€675
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.
€1 125
€675
FMG01/Pt
High Resolution Force Modulation Conductive Silicon AFM Cantilevers FMG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 45-115kHz, force constant 0.5 -9.5N/m.
from
€360
FMG01/Pt
High Resolution Force Modulation Conductive Silicon AFM Cantilevers FMG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 45-115kHz, force constant 0.5 -9.5N/m.
from
€360
DCP30
Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.
€575
DCP30
Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.
€575
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