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Calibration Gratings
TipsNano Co supplies with the full set of calibration standards for AFM lateral and vertical calibration including submicron calibration in X or/and Y direction, test grating for the tip shape estimation, Highly Oriented Pyrolytic Graphite (HOPG), DNA and PFM test samples.
TGG1
Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.
€200
TGG1
Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.
€200
TGZ1
Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.
€120
TGZ1
Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.
€120
TGT1
Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.
€300
TGT1
Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.
€300
TGQ1
Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.
€300
TGQ1
Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.
€300
TGZ4
Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.
€120
TGZ4
Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.
€120
TDG01
Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.
€300
TDG01
Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.
€300
TGX1
Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.
€200
TGX1
Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.
€200
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