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AFM SpecialThe cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface.
NSG10_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
€750
NSG10_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
€750
NSG01_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
€750
NSG01_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
€750
VIT_P_C
TOP VISUAL High Resolution Contact VIT_P_C series with no reflective coating, resonant frequency 825 kHz, force constant 0.061 N/m.
€565
VIT_P_C
TOP VISUAL High Resolution Contact VIT_P_C series with no reflective coating, resonant frequency 825 kHz, force constant 0.061 N/m.
€565
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 210490 kHz, force constant 12110 N/m.
from
€650
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 210490 kHz, force constant 12110 N/m.
from
€650
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from
€450
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from
€450
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from
€450
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from
€450
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140390kHz, force constant 3,137,6N/m, whisker length 1µm.
from
€500
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140390kHz, force constant 3,137,6N/m, whisker length 1µm.
from
€500
CPC
Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 621kHz, force constant 0,020,77N/m.
from
€790
CPC
Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 621kHz, force constant 0,020,77N/m.
from
€790
CPN
Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200500kHz, force constant 10130 N/m.
from
€790
CPN
Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200500kHz, force constant 10130 N/m.
from
€790
CPFM
Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45115kHz, force constant 0,59,5 N/m.
from
€790
CPFM
Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45115kHz, force constant 0,59,5 N/m.
from
€790
DRPS_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, typical curvature radius 10 nm.
€1 950
€1 350
DRPS_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, typical curvature radius 10 nm.
€1 950
€1 350
DEP01_SS
Highly Conductive Long Lasting Super Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60125kHz, force constant 1.24.5 N/m, curvature radius <5nm.
€1 215
DEP01_SS
Highly Conductive Long Lasting Super Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60125kHz, force constant 1.24.5 N/m, curvature radius <5nm.
€1 215
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140220kHz, force constant 2060 N/m, curvature radius <10nm.
€810
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140220kHz, force constant 2060 N/m, curvature radius <10nm.
€810
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60125kHz, force constant 1.24.5 N/m, curvature radius <10nm.
€810
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60125kHz, force constant 1.24.5 N/m, curvature radius <10nm.
€810
VIT_P/Pt
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 210490 kHz, force constant 12110 N/m.
€1 200
VIT_P/Pt
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 210490 kHz, force constant 12110 N/m.
€1 200
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210490 kHz, force constant 12110 N/m.
from
€565
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210490 kHz, force constant 12110 N/m.
from
€565
HA_NC/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.
€750
HA_NC/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.
€750
DCP30
Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280510kHz, force constant 40142N/m.
€750
DCP30
Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280510kHz, force constant 40142N/m.
€750
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, typical curvature radius 25nm.
€1 125
€675
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, typical curvature radius 25nm.
€1 125
€675
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45115kHz, force constant 0.59.5N/m, typical curvature radius 2nm, Al reflective coating.
€750
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45115kHz, force constant 0.59.5N/m, typical curvature radius 2nm, Al reflective coating.
€750
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 839kHz, force constant 0,010,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€750
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 839kHz, force constant 0,010,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€750
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140220kHz, force constant 2060 N/m, curvature radius <5nm
€1 215
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140220kHz, force constant 2060 N/m, curvature radius <5nm
€1 215
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240440 kHz, force constant 22100 N/m, typical curvature radius 2nm, Al reflective coating.
€750
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240440 kHz, force constant 22100 N/m, typical curvature radius 2nm, Al reflective coating.
€750
