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Cantilever series
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AFM Special

The cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface.

NSG10_DLC NSG10_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.

  €750
Аdd to cart
NSG10_DLC NSG10_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.

  €750
Аdd to cart
NSG01_DLC NSG01_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.

  €750
Аdd to cart
NSG01_DLC NSG01_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.

  €750
Аdd to cart
VIT_P_C VIT_P_C

TOP VISUAL High Resolution Contact VIT_P_C series with no reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.

  €650
Аdd to cart
VIT_P_C VIT_P_C

TOP VISUAL High Resolution Contact VIT_P_C series with no reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.

  €650
Аdd to cart
VIT_P/IR VIT_P/IR

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €650
Аdd to cart
VIT_P/IR VIT_P/IR

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €650
Аdd to cart
HA_C_DCP HA_C_DCP

Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.

from €450
Аdd to cart
HA_C_DCP HA_C_DCP

Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.

from €450
Аdd to cart
HA_FM_DCP HA_FM_DCP

Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.

from €450
Аdd to cart
HA_FM_DCP HA_FM_DCP

Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.

from €450
Аdd to cart
NSC05 NSC05

Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.

from €500
Аdd to cart
NSC05 NSC05

Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.

from €500
Аdd to cart
CPC CPC

Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 6-21kHz, force constant 0,02-0,77N/m.

from €890
Аdd to cart
CPC CPC

Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 6-21kHz, force constant 0,02-0,77N/m.

from €890
Аdd to cart
CPN CPN

Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200-500kHz, force constant 10-130 N/m.

from €890
Аdd to cart
CPN CPN

Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200-500kHz, force constant 10-130 N/m.

from €890
Аdd to cart
CPFM CPFM

Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45-115kHz, force constant 0,5-9,5 N/m.

from €890
Аdd to cart
CPFM CPFM

Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45-115kHz, force constant 0,5-9,5 N/m.

from €890
Аdd to cart
DRPS_In DRPS_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10 nm.

  €1 350
Аdd to cart
DRPS_In DRPS_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10 nm.

  €1 350
Аdd to cart
DEP01_SS DEP01_SS

Highly Conductive Long Lasting Super Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <5nm.

  €1 350
Аdd to cart
DEP01_SS DEP01_SS

Highly Conductive Long Lasting Super Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <5nm.

  €1 350
Аdd to cart
DEP01 DEP01

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP01 DEP01

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP30R DEP30R

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius 10 +/- 5nm.

  €900
Аdd to cart
DEP30R DEP30R

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius 10 +/- 5nm.

  €900
Аdd to cart
DEP_HARD DEP_HARD

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 750-1450kHz, force constant 650-1350 N/m, curvature radius 10 +/- 5nm.

  €2 250
Аdd to cart
DEP_HARD DEP_HARD

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 750-1450kHz, force constant 650-1350 N/m, curvature radius 10 +/- 5nm.

  €2 250
Аdd to cart
VIT_P/Pt VIT_P/Pt

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.

  €1 200
Аdd to cart
VIT_P/Pt VIT_P/Pt

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.

  €1 200
Аdd to cart
HA_NC/FD HA_NC/FD

The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.

  €750
Аdd to cart
HA_NC/FD HA_NC/FD

The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.

  €750
Аdd to cart
DCP30 DCP30

Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.

  €750
Аdd to cart
DCP30 DCP30

Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.

  €750
Аdd to cart
DRP_In DRP_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.

  €790
Аdd to cart
DRP_In DRP_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.

  €790
Аdd to cart
FMG01_SS FMG01_SS

Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
FMG01_SS FMG01_SS

Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
CSG10_SS CSG10_SS

Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
CSG10_SS CSG10_SS

Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius <5nm

  €1 350
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius <5nm

  €1 350
Аdd to cart
NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
Аdd to cart
VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
Аdd to cart

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