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AFM SpecialThe cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface.
NSG10_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
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€600
NSG10_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
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€600
NSG01_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
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€600
NSG01_DLC
Super Sharp DiamondLike Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
from
€600
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 4096kHz, force constant 13N/m, typical curvature radius 2nm, Al reflective coating.
€600
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 4096kHz, force constant 13N/m, typical curvature radius 2nm, Al reflective coating.
€600
CSC05
Whisker Type High Aspect Ratio Contact Silicon AFM Cantilevers CSC05 series, resonant frequency 839kHz, force constant 0.010.05N/m, whisker length 0.4 µm.
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€400
CSC05
Whisker Type High Aspect Ratio Contact Silicon AFM Cantilevers CSC05 series, resonant frequency 839kHz, force constant 0.010.05N/m, whisker length 0.4 µm.
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€400
DCP10
Diamond Coated Semicontact / Noncontact Conductive Probes DCP10 series, resonant frequency 190325 kHz, force constant 5,522.5 N/m.
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€420
DCP10
Diamond Coated Semicontact / Noncontact Conductive Probes DCP10 series, resonant frequency 190325 kHz, force constant 5,522.5 N/m.
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€420
DCP11
Diamond Coated Semicontact / Noncontact Conductive Probes DCP11 series, each chip has 2 rectangular cantilevers, typical resonant frequency 255kHz/ 150kHz, force constant 11.5N/m / 5,5N/m, Au reflective coating.
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€450
DCP11
Diamond Coated Semicontact / Noncontact Conductive Probes DCP11 series, each chip has 2 rectangular cantilevers, typical resonant frequency 255kHz/ 150kHz, force constant 11.5N/m / 5,5N/m, Au reflective coating.
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€450
DCP20
Diamond Coated Semicontact / Noncontact Conductive Probes DCP20 series with triangular cantilever, resonant frequency 260630 kHz, force constant 2891 N/m.
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€450
DCP20
Diamond Coated Semicontact / Noncontact Conductive Probes DCP20 series with triangular cantilever, resonant frequency 260630 kHz, force constant 2891 N/m.
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€450
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 200400 kHz, force constant 2595 N/m.
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€505
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 200400 kHz, force constant 2595 N/m.
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€505
VIT_P_CA
TOP VISUAL High Resolution Contact VIT_P_CA series with Al reflective coating, resonant frequency 825 kHz, force constant 0.061 N/m.
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€505
VIT_P_CA
TOP VISUAL High Resolution Contact VIT_P_CA series with Al reflective coating, resonant frequency 825 kHz, force constant 0.061 N/m.
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€505
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
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€450
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
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€450
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
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€450
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
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€450
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140390kHz, force constant 3,137,6N/m, whisker length 1µm.
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€400
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140390kHz, force constant 3,137,6N/m, whisker length 1µm.
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€400
DRP_In_C
Calibrated Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, curvature radius <15nm.
€2,250
DRP_In_C
Calibrated Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, curvature radius <15nm.
€2,250
HA_HR_DCP
Diamond Coated High Resolution High Accuracy Semicontact AFM Cantilevers HA_HR series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 580 kHz / 330 kHz, force constant 85 N/m / 35 N/m.
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€700
HA_HR_DCP
Diamond Coated High Resolution High Accuracy Semicontact AFM Cantilevers HA_HR series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 580 kHz / 330 kHz, force constant 85 N/m / 35 N/m.
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€700
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, curvature radius <35nm.
€1,125
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 5001000kHz, force constant 100600 N/m, curvature radius <35nm.
€1,125
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140220kHz, force constant 2060 N/m, typical curvature radius 2nm (guaranteed <5nm).
€1,350
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140220kHz, force constant 2060 N/m, typical curvature radius 2nm (guaranteed <5nm).
€1,350
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140220kHz, force constant 2060 N/m, curvature radius <10nm.
€900
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140220kHz, force constant 2060 N/m, curvature radius <10nm.
€900
DEP_C
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for contact electrical AFM modes, resonant frequency 2040kHz, force constant 0.20.9 N/m, curvature radius <10nm.
€900
DEP_C
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for contact electrical AFM modes, resonant frequency 2040kHz, force constant 0.20.9 N/m, curvature radius <10nm.
€900
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60125kHz, force constant 1.24.5 N/m, curvature radius <10nm.
€900
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60125kHz, force constant 1.24.5 N/m, curvature radius <10nm.
€900
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200400 kHz, force constant 2595 N/m.
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€455
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200400 kHz, force constant 2595 N/m.
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€455
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 839kHz, force constant 0,010,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€600
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 839kHz, force constant 0,010,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€600
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240440 kHz, force constant 22100 N/m, typical curvature radius 2nm, Al reflective coating.
€600
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240440 kHz, force constant 22100 N/m, typical curvature radius 2nm, Al reflective coating.
€600
