## Select by: |
## AFM Special
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
€750
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
€750
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
€750
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
€750
CSC05
Whisker Type High Aspect Ratio Contact Silicon AFM Cantilevers CSC05 series, resonant frequency 8-39kHz, force constant 0.01-0.05N/m, whisker length 0.4 µm.
from
€400
CSC05
Whisker Type High Aspect Ratio Contact Silicon AFM Cantilevers CSC05 series, resonant frequency 8-39kHz, force constant 0.01-0.05N/m, whisker length 0.4 µm.
from
€400
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 200-490 kHz, force constant 25-95 N/m.
from
€505
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 200-490 kHz, force constant 25-95 N/m.
from
€505
VIT_P_C-A
TOP VISUAL High Resolution Contact VIT_P_C-A series with Al reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
€1,390
VIT_P_C-A
TOP VISUAL High Resolution Contact VIT_P_C-A series with Al reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
€1,390
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from
€450
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from
€450
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from
€450
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from
€450
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.
from
€400
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.
from
€400
CPC
Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 6-21kHz, force constant 0,02-0,77N/m.
from
€790
CPC
Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 6-21kHz, force constant 0,02-0,77N/m.
from
€790
CPN
Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200-500kHz, force constant 10-130 N/m.
from
€790
CPN
Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200-500kHz, force constant 10-130 N/m.
from
€790
CPFM
Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45-115kHz, force constant 0,5-9,5 N/m.
from
€790
CPFM
Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45-115kHz, force constant 0,5-9,5 N/m.
from
€790
HA_HR_DCP
Diamond Coated High Resolution High Accuracy Semicontact AFM Cantilevers HA_HR series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 580 kHz / 330 kHz, force constant 85 N/m / 35 N/m.
from
€650
HA_HR_DCP
Diamond Coated High Resolution High Accuracy Semicontact AFM Cantilevers HA_HR series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 580 kHz / 330 kHz, force constant 85 N/m / 35 N/m.
from
€650
DRPS_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10 nm.
€1,950
€1,350
DRPS_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10 nm.
€1,950
€1,350
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.
€810
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.
€810
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.
€810
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.
€810
VIT_P/Pt
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 200-400 kHz, force constant 25-95 N/m.
€1,140
VIT_P/Pt
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 200-400 kHz, force constant 25-95 N/m.
€1,140
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m.
from
€455
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m.
from
€455
HA_C/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for contact modes, resonant frequency 19 kHz, force constant 0.26 N/m, typical curvature radius <10 nm.
from
€580
HA_C/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for contact modes, resonant frequency 19 kHz, force constant 0.26 N/m, typical curvature radius <10 nm.
from
€580
HA_NC/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.
from
€580
HA_NC/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.
from
€580
PHA_NC
High Aspect Ratio Premium Etalon tips PHA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
from
€320
PHA_NC
High Aspect Ratio Premium Etalon tips PHA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
from
€320
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.
€1,125
€675
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.
€1,125
€675
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 40-96kHz, force constant 1-3N/m, typical curvature radius 2nm, Al reflective coating.
€600
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 40-96kHz, force constant 1-3N/m, typical curvature radius 2nm, Al reflective coating.
€600
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€600
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€600
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
€600
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
€600
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