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SNOM

SNOM — scanning near-field optical microscope, scanning near-field optical microscopy. In near-field optical microscopy uses different principles of construction of the image of object, which allow to overcome the difficulties associated with diffraction of light and to realize a spatial resolution of 10 nm and better. Higher resolution Bohm is achieved by detecting scattering of light from the object under study at distances smaller than the wavelength of light. In the case that the probe (detector) of the near-field microscope provided with a device for the spatial scan, the scanning device called optical near-field microscope. This microscope allows to obtain a raster image of surfaces and objects with a resolution below the diffraction limit.

MF114_NTF MF114_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 185±35 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 780-970 nm.

  €2,500
Аdd to cart
MF114_NTF MF114_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 185±35 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 780-970 nm.

  €2,500
Аdd to cart
MF115_NTF MF115_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 250 ± 50 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 980-1600 nm.

  €2,500
Аdd to cart
MF115_NTF MF115_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 250 ± 50 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 980-1600 nm.

  €2,500
Аdd to cart

 

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