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AFM SpecialThe cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface. 
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
$862.50
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
$862.50
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
$862.50
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
$862.50
VIT_P_C
TOP VISUAL High Resolution Contact VIT_P_C series with no reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
$747.50
VIT_P_C
TOP VISUAL High Resolution Contact VIT_P_C series with no reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
$747.50
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from $747.50
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from $747.50
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from $517.50
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from $517.50
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from $517.50
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from $517.50
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.
from $575
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.
from $575
CPC
Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 6-21kHz, force constant 0,02-0,77N/m.
from $1,023.50
CPC
Colloidal probes for Contact mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 6-21kHz, force constant 0,02-0,77N/m.
from $1,023.50
CPN
Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200-500kHz, force constant 10-130 N/m.
from $1,023.50
CPN
Colloidal probes for Noncontact/Semicontact modes, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 200-500kHz, force constant 10-130 N/m.
from $1,023.50
CPFM
Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45-115kHz, force constant 0,5-9,5 N/m.
from $1,023.50
CPFM
Colloidal probes for Force Modulation mode, sphere material SiO2, 5 sphere sizes from 2um till 15um, no reflective coating, resonant frequency 45-115kHz, force constant 0,5-9,5 N/m.
from $1,023.50
DRPS_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10 nm.
$1,552.50
DRPS_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10 nm.
$1,552.50
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.
$1,035
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.
$1,035
DEP01_SS
Highly Conductive Long Lasting Super Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <5nm.
$1,552.50
DEP01_SS
Highly Conductive Long Lasting Super Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <5nm.
$1,552.50
DEP30R
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius 10 +/- 5nm.
$1,035
DEP30R
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius 10 +/- 5nm.
$1,035
DEP_HARD
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 750-1450kHz, force constant 650-1350 N/m, curvature radius 10 +/- 5nm.
$2,587.50
DEP_HARD
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 750-1450kHz, force constant 650-1350 N/m, curvature radius 10 +/- 5nm.
$2,587.50
VIT_P/Pt
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.
$1,380
VIT_P/Pt
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/Pt series with reflective and tip sides PtIr coating, resonant frequency 210-490 kHz, force constant 12-110 N/m.
$1,380
HA_NC/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.
$920
HA_NC/FD
The best AFM tips for routine measurements at the reasonable price! Long Lasting Probes with Single Crystal Full Diamond tip for noncontact/semicontact modes, resonant frequency 140 kHz, force constant 3.5 N/m, typical curvature radius <10 nm.
$920
DCP30
Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.
$862.50
DCP30
Diamond coated Noncontact Conductive Silicon AFM Cantilevers DCP30 series, resonant frequency 280-510kHz, force constant 40-142N/m.
$862.50
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.
$908.50
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.
$908.50
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.
$862.50
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 45-115kHz, force constant 0.5-9.5N/m, typical curvature radius 2nm, Al reflective coating.
$862.50
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
$862.50
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
$862.50
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius <5nm
$1,552.50
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius <5nm
$1,552.50
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
$862.50
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
$862.50
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from $649.75
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from $649.75
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