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AFM Standard

Conductive

AFM Special

Colloidal

Cantilevers with micron spheres attached to tipless probes

Single Crystal Diamond

SNOM

HOPG

Calibration

TERS

Main page > Catalog > AFM Special > VIT_P_C

VIT_P_C

VIT_P_C/15

Set of 15 cantilevers

€650

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Product Description

TOP VISUAL High Resolution Contact Silicon AFM Cantilevers VIT_P_C series are specially designed for tip or laser spot precise positioning over the point of interest.
Typical Resonant Frequency 16 kHz (guaranteed range 8-25 kHz), Typical Force Constant 0.3 N/m (guaranteed range 0.06-1N/m).
Cantilevers don't have any reflective coating.
Probes are packed in boxes with 15 pieces.

General Features

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Reflective side coating	No coating
Tip coating	No
Tip curvature radius	typical 6nm, guaranteed 10nm

Special Features

Cantilever series	Cantilever length, L±10µm	Cantilever width, W±5µm	Cantilever thickness, T±1.0µm	Resonant frequency, kHz			Force constant, N/m
Cantilever series	Cantilever length, L±10µm	Cantilever width, W±5µm	Cantilever thickness, T±1.0µm	min	typical	max	min	typical	max
VIT_P_C	450	50	2.0	7	15	25	0.02	0.2	0.75