## Select by: |
## AFM Special
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
from
€600
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
from
€600
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
from
€600
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
from
€600
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 40-96kHz, force constant 1-3N/m, typical curvature radius 2nm, Al reflective coating.
€600
FMG01_SS
Super Sharp High Resolution Force Modulation Silicon AFM Cantilevers FMG01_SS series, resonant frequency 40-96kHz, force constant 1-3N/m, typical curvature radius 2nm, Al reflective coating.
€600
CSC05
Whisker Type High Aspect Ratio Contact Silicon AFM Cantilevers CSC05 series, resonant frequency 8-39kHz, force constant 0.01-0.05N/m, whisker length 0.4 µm.
from
€400
CSC05
Whisker Type High Aspect Ratio Contact Silicon AFM Cantilevers CSC05 series, resonant frequency 8-39kHz, force constant 0.01-0.05N/m, whisker length 0.4 µm.
from
€400
DCP10
Diamond Coated Semicontact / Noncontact Conductive Probes DCP10 series, resonant frequency 190-325 kHz, force constant 5,5-22.5 N/m.
from
€420
DCP10
Diamond Coated Semicontact / Noncontact Conductive Probes DCP10 series, resonant frequency 190-325 kHz, force constant 5,5-22.5 N/m.
from
€420
DCP11
Diamond Coated Semicontact / Noncontact Conductive Probes DCP11 series, each chip has 2 rectangular cantilevers, typical resonant frequency 255kHz/ 150kHz, force constant 11.5N/m / 5,5N/m, Au reflective coating.
from
€450
DCP11
Diamond Coated Semicontact / Noncontact Conductive Probes DCP11 series, each chip has 2 rectangular cantilevers, typical resonant frequency 255kHz/ 150kHz, force constant 11.5N/m / 5,5N/m, Au reflective coating.
from
€450
DCP20
Diamond Coated Semicontact / Noncontact Conductive Probes DCP20 series with triangular cantilever, resonant frequency 260-630 kHz, force constant 28-91 N/m.
from
€450
DCP20
Diamond Coated Semicontact / Noncontact Conductive Probes DCP20 series with triangular cantilever, resonant frequency 260-630 kHz, force constant 28-91 N/m.
from
€450
FMG01_BIO
Colloidal probes for Force Modulation / Tapping Mode FMG01 series with SiO2 spheres, size 270/650/900nm, Au reflective coating, resonant frequency 40-96kHz, force constant 1-3N/m.
€550
FMG01_BIO
Colloidal probes for Force Modulation / Tapping Mode FMG01 series with SiO2 spheres, size 270/650/900nm, Au reflective coating, resonant frequency 40-96kHz, force constant 1-3N/m.
€550
NSG01_BIO
Colloidal probes for Force Modulation / Tapping Mode FMG01 series with SiO2 spheres, size 270/650/900nm, Au reflective coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m.
€550
NSG01_BIO
Colloidal probes for Force Modulation / Tapping Mode FMG01 series with SiO2 spheres, size 270/650/900nm, Au reflective coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m.
€550
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 200-400 kHz, force constant 25-95 N/m.
from
€505
VIT_P/IR
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series with Au reflective coating, resonant frequency 200-400 kHz, force constant 25-95 N/m.
from
€505
VIT_P_C-A
TOP VISUAL High Resolution Contact VIT_P_C-A series with Al reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
from
€505
VIT_P_C-A
TOP VISUAL High Resolution Contact VIT_P_C-A series with Al reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
from
€505
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from
€450
HA_FM_DCP
Diamond Coated High Resolution Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 157 kHz / 112 kHz, force constant 14.5 N/m / 8.3 N/m.
from
€450
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from
€450
HA_C_DCP
Diamond Coated High Resolution High Accuracy Contact / Lateral Force AFM Cantilevers HA_C series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 48 kHz / 26 kHz, force constant 1.4 N/m / 0.7 N/m.
from
€450
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.
from
€400
NSC05
Whisker Type High Aspect Ratio Semicontact / Noncontact Silicon AFM Cantilevers NSC05 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m, whisker length 1µm.
from
€400
CPC
Colloidal probes for Contact mode, sphere material BSG/SiO2, 4 sphere sizes from 5um till 20um, Au reflective coating, resonant frequency 8-37kHz, force constant 0,01-0,6N/m.
from
€1,000
CPC
Colloidal probes for Contact mode, sphere material BSG/SiO2, 4 sphere sizes from 5um till 20um, Au reflective coating, resonant frequency 8-37kHz, force constant 0,01-0,6N/m.
from
€1,000
DRP_In_C
Calibrated Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, curvature radius <15nm.
€2,250
DRP_In_C
Calibrated Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, curvature radius <15nm.
€2,250
HA_HR_DCP
Diamond Coated High Resolution High Accuracy Semicontact AFM Cantilevers HA_HR series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 580 kHz / 330 kHz, force constant 85 N/m / 35 N/m.
from
€700
HA_HR_DCP
Diamond Coated High Resolution High Accuracy Semicontact AFM Cantilevers HA_HR series with doped diamond coating, each chip has 2 cantilevers, resonant frequency 580 kHz / 330 kHz, force constant 85 N/m / 35 N/m.
from
€700
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, curvature radius <35nm.
€1,125
DRP_In
Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, curvature radius <35nm.
€1,125
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).
€1,350
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).
€1,350
DEP30H
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 300-400kHz, force constant 60-100 N/m, curvature radius <10nm.
€900
DEP30H
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 300-400kHz, force constant 60-100 N/m, curvature radius <10nm.
€900
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.
€900
DEP30
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.
€900
DEP_C
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for contact electrical AFM modes, resonant frequency 20-40kHz, force constant 0.2-0.9 N/m, curvature radius <10nm.
€900
DEP_C
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for contact electrical AFM modes, resonant frequency 20-40kHz, force constant 0.2-0.9 N/m, curvature radius <10nm.
€900
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.
€900
DEP01
Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.
€900
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m.
from
€455
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m.
from
€455
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