sales@tipsnano.com
more contacts
 
MFM_LM
MFM_LM MFM_LM MFM_LM MFM_LM MFM_LM MFM_LM

MFM_LM

MFM_LM/15
Set of 15 cantilevers
€870 +
Аdd to cart

Product Description

Low Moment Magnetic High Resolution Silicon AFM Cantilevers MFM_LM series.are specially designed for work in magnetic AFM mode (MFM) with low coercive magnetic samples.
MFM_LM probes have thinner magnetic coating than ordinary magnetic tips. So, such low coercive magnetic samples as iron garnet films, ordered array of interaсting Co particles, ordered array of vertically magnetized 35nm CoPt dots can be measured (see MFM images obtained by MFM_LM probes in the pictures bar). Thanks to their own low magnetic fields low moment MFM_LM probes allow to decrease the probe influence on the researched sample while scanning.

Due to special defensive layers which prevent the ferromagnetic tip coating from oxidizing, all MFM probes have a long shelf life, and the small tip curvature radius enables you to obtain good high resolution images. 

Typical Resonant Frequency of the probes 70 kHz (guaranteed range 47-90kHz), typical Force Constant 3N/m (guaranteed range 1-5N/m). Cantilever has Al reflective side coating to increase laser signal.

Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

General Features

Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side coating Al
Tip coating CoCr
Tip curvature radius ~ 30nm

Special Features

Cantilever series Cantilever length, L±10µm Cantilever width, W±5µm Cantilever thickness, T±0.5µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
MFM_LM 225 32 2.5 47 70 90 1 3 5
 

successfully added to cart!

Continue shoppingGo to cart