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TDG01 €300 +
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Product Description

Calibration grating TDG01 is intended for AFM submicron calibration in X or Y direction. Period is 278nm.

General Features

Structure the grating is formed on the chalcogenide glass coated by Al
Pattern type parallel ridges in X or Y direction, 1-Dimensional
Period 278 ± 1 nm
Height > 55 nm
Chip size diameter 12,5 mm, thickness - 2,5 mm
Effective area central diameter 9 mm

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