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Calibration
To determine the credibility of studies by AFM — microscopy testing and calibration of microscope work and test the quality of probes (scale of X-, Y-, Z - coordinates, the radius of the tip of the cantilever, linearity and orthogonality of the axes of the scan). For calibration and determination of the working shapes of the probes used special test structures with known topography. 
TGS1_PTB
Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
$990
TGS1_PTB
Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
$990
TGSFull+
Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
$1,430
TGSFull+
Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
$1,430
TGS1F
Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm, 1517±20nm.
$330
TGS1F
Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm, 1517±20nm.
$330
TGSFull
Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
$1,265
TGSFull
Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
$1,265
TGS2
Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
$990
TGS2
Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
$990
TGS1
Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
$275
TGS1
Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
$275
SiC/0.75
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.
$264
SiC/0.75
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.
$264
SiC/1.5
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.
$264
SiC/1.5
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.
$264
TGG1
Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.
$220
TGG1
Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.
$220
TGZ2
Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110 ± 2nm.
$132
TGZ2
Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110 ± 2nm.
$132
TGZ1
Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.
$132
TGZ1
Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.
$132
TGQ1
Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.
$330
TGQ1
Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.
$330
PFM03
Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.
$495
PFM03
Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.
$495
TGZ4
Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.
$132
TGZ4
Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.
$132
TDG01
Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.
$330
TDG01
Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.
$330
TGX1
Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.
$220
TGX1
Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.
$220
TGL1
Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
$385
TGL1
Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
$385
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