News
16.03.2025
![]() Specially designed cantilever sets representing the most popular customers' requests.
01.08.2023
![]() TGL1 grating for 2-D and 3-D calibration with three X/Y periods - 6um,10um, 20um, three structures - lineas, pillars, circles and step height 168nm.
28.04.2022
All news ![]() Piezoelectric single crystal lead PMN-PT ![]() |
![]() SPECIAL OFFER! Mixed Cantilever Set with super sharp and diamond tips: NSG30_SS/5 + NSG01_DLC/5 + HA_NC/FD/5
  €990
![]() SPECIAL OFFER! Mixed Cantilever Set with super sharp and diamond tips: NSG30_SS/5 + NSG01_DLC/5 + HA_NC/FD/5
  €990
![]() SPECIAL OFFER! Mixed Cantilever Set for contact, semicontact and conductive modes: NSG30/10 + CSG01/10 + FMG01/Pt/10
  €690
![]() SPECIAL OFFER! Mixed Cantilever Set for contact, semicontact and conductive modes: NSG30/10 + CSG01/10 + FMG01/Pt/10
  €690
![]() TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from €565
![]() TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from €565
![]() Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.
  €350
![]() Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.
  €350
![]() Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
  €750
![]() Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
  €750
![]() High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating
  €420
![]() High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating
  €420
![]() Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.
  €300
![]() Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.
  €300
![]() High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.
from €505
![]() High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.
from €505
![]() High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.
from €350
![]() High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.
from €350
![]() Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.
  €950
![]() Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.
  €950
![]() High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.
from €690
![]() High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.
from €690
![]() Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
  €350
![]() Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
  €350
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