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SS_FD_SET/15 SS_FD_SET/15

SPECIAL OFFER! Mixed Cantilever Set with super sharp and diamond tips: NSG30_SS/5 + NSG01_DLC/5  + HA_NC/FD/5

  €990
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SS_FD_SET/15 SS_FD_SET/15

SPECIAL OFFER! Mixed Cantilever Set with super sharp and diamond tips: NSG30_SS/5 + NSG01_DLC/5  + HA_NC/FD/5

  €990
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MSSET/30 MSSET/30

SPECIAL OFFER! Mixed Cantilever Set for contact, semicontact and conductive modes: NSG30/10 + CSG01/10 + FMG01/Pt/10

  €690
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MSSET/30 MSSET/30

SPECIAL OFFER! Mixed Cantilever Set for contact, semicontact and conductive modes: NSG30/10 + CSG01/10 + FMG01/Pt/10

  €690
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VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
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VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
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TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €350
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TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €350
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NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
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NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
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NSG_L NSG_L

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating

  €420
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NSG_L NSG_L

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating

  €420
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PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
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PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
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NSG30/Pt NSG30/Pt

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.

from €505
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NSG30/Pt NSG30/Pt

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.

from €505
Аdd to cart
NSG30 NSG30

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.

from €350
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NSG30 NSG30

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.

from €350
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MFM_LM MFM_LM

Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.

  €950
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MFM_LM MFM_LM

Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.

  €950
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MFM01 MFM01

High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.

from €690
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MFM01 MFM01

High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.

from €690
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TGL1 TGL1

Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.

  €350
Аdd to cart
TGL1 TGL1

Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.

  €350
Аdd to cart

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