News
01.08.2023
New calibration gratingTGL1 grating for 2-D and 3-D calibration with three X/Y periods - 6um,10um, 20um, three structures - lineas, pillars, circles and step height 168nm.
28.04.2022
New test sample for Piezoresponse Force Microscopy Piezoelectric single crystal lead PMN-PT
19.03.2018
All news 
Probes with Full Diamond tipsThe best AFM tips for both routine and special measurements at the reasonable price! Full diamond tip with curvature radius less than 10nm. 
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VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from €565
VIT_P
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.
from €565
TGT1
Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.
€350
TGT1
Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.
€350
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
€750
NSG30_SS
Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.
€750
NSG_L
High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating
€420
NSG_L
High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating
€420
PFM_S
Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.
€300
PFM_S
Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.
€300
NSG30/Pt
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.
from €505
NSG30/Pt
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.
from €505
NSG30
High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.
from €350
NSG30
High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.
from €350
MFM_LM
Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.
€950
MFM_LM
Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.
€950
MFM01
High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.
from €690
MFM01
High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.
from €690
TGL1
Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
€350
TGL1
Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
€350
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius <5nm
€1 350
DRP30_SS
Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 150-450kHz, force constant 22-62 N/m, curvature radius <5nm
€1 350
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€750
CSG10_SS
Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.
€750
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