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TERSTERS — Raman Spectroscopy with the enhancement of the tip. Measurements based on AFM microscopy. Mode TERS Raman spectrum is enhanced when a sharp tip with a gold coating approaches the illuminated sample surface. Using the cantilever of an AFM as an amplifier, measure the chemical properties of the sample in the nano-range by using the built-in Raman spectrometer, simultaneously obtaining topographic data by using ASM. 
VIT_P_C/TERS
TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Contact Mode, no reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
€3 500
VIT_P_C/TERS
TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Contact Mode, no reflective coating, resonant frequency 8-25 kHz, force constant 0.06-1 N/m.
€3 500
VIT_P/TERS
TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Semicontact/Noncontact mode, uncoated, resonant frequency 200-490 kHz, force constant 25-95 N/m.
€3 500
VIT_P/TERS
TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Semicontact/Noncontact mode, uncoated, resonant frequency 200-490 kHz, force constant 25-95 N/m.
€3 500
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