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Main page > Catalog > Calibration > Calibration Gratings > TGX1

TGX1

€250

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Product Description

Calibration grating TGX1 is intended for

lateral calibration of AFM scanners
detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects;
determination of the tip sharpness.

AFM image of TGX1 grating.

General Features

Structure	Si
Pattern type	chessboard-like array of square pillars with sharp undercut edges
Period	3±0,05 µm
Height	~ 0,6 µm
Chip size	5x5x0,5 mm
Effective area	central square 3x3 mm
Edge curvature radius	less then 10nm