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Calibration
To determine the credibility of studies by AFM — microscopy testing and calibration of microscope work and test the quality of probes (scale of X-, Y-, Z - coordinates, the radius of the tip of the cantilever, linearity and orthogonality of the axes of the scan). For calibration and determination of the working shapes of the probes used special test structures with known topography. 
TGS1F
Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm, 1517±20nm.
€720
TGS1F
Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm, 1517±20nm.
€720
TGS1_PTB
Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
€1 200
TGS1_PTB
Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
€1 200
TGSFull
Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
€1 590
TGSFull
Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
€1 590
TGS2
Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
€1 290
TGS2
Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
€1 290
TGS1
Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
€420
TGS1
Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
€420
SiC/0.75
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.
€240
SiC/0.75
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.
€240
TGSFull+
Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
€1 840
TGSFull+
Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
€1 840
SiC/1.5
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.
€240
SiC/1.5
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.
€240
TGG1
Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.
€200
TGG1
Calibration grating TGG1 for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, tip sharpness characterization.
€200
TGZ2
Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110 ± 2nm.
€170
TGZ2
Calibration grating TGZ2 for Z and X (or Y) calibration. Step height 110 ± 2nm.
€170
TGZ1
Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.
€170
TGZ1
Calibration grating TGZ1 for Z and X (or Y) calibration. Step height 20,0±1.5nm.
€170
TGQ1
Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.
€350
TGQ1
Calibration grating TGQ1 for simultenious calibration in X,Y,Z directions. Step height 20±1.5nm.
€350
PFM03
Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.
€450
PFM03
Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.
€450
TGZ4
Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.
€340
TGZ4
Calibration grating TGZ4 for Z and X (or Y) calibration. Step height 1517±20nm.
€340
TDG01
Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.
€300
TDG01
Calibration grating TDG01 for AFM submicron calibration in the X or Y direction. Period is 278nm.
€300
TGX1
Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.
€250
TGX1
Calibration grating TGX1 for lateral scanner calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip sharpness.
€250
TGL1
Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
€350
TGL1
Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.
€350
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