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AFM Standard

Conductive

AFM Special

Colloidal

Cantilevers with micron spheres attached to tipless probes

Single Crystal Diamond

SNOM

SNOM Cantilevers

SNOM Fiber Probes

HOPG

HOPG for STM / AFM applications

Calibration

TERS

Main page > Catalog > AFM Standard > NSG10n/TiN

NSG10n/TiN

NSG10n/TiN/15

Set of 15 cantilevers

€360

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NSG10n/TiN/50

Set of 50 probes

€950

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Product Description

Noncontact/Semicontact Conductive Probes NSG10n/TiN series with TiN tips coating.
Resonant frequency 190-325 kHz, force constant 5,5-22.5 N/m.
Cantilever has Au reflective side coating to increase laser signal.

Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

General Features

Material	Single Crystal Silicon
Chip size	3.6×1.6×0.4mm
Reflective side coating	Au
Tip coating	TiN
Tip curvature radius	< 35nm

Special Features

Cantilever series	Cantilever length, L±5µm	Cantilever width, W±3µm	Cantilever thickness, T±0.5µm	Resonant frequency, kHz			Force constant, N/m
Cantilever series	Cantilever length, L±5µm	Cantilever width, W±3µm	Cantilever thickness, T±0.5µm	min	typical	max	min	typical	max
NSG10/TiN	100	35	2.0	190	255	325	5.5	11.5	22.5