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HA_NC/W2C+
Product DescriptionHigh Resolution High Accuracy AFM Cantilevers HA_NC/W2C+ series are designed for Semicontact ( Intermittent ), Noncontact and electrical applications (SKM, SCM, SRIM, EFM, LAO Lithography). Hard and stable coating provides long time perfomance in all electrical modes. Specially doped W2C+ coating allows to avoid probes from oxidation, extends probe lifetime and makes it possible to operate at high-humidity conditions. Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 235kHz / 140kHz (dispersion ±10%). Typical Force Constant 12N/m / 3.5N/m (dispersion ±20%). Cantilever has Au reflective and W2C tip side coatings. Probes are also available without tip coating. Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.
High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:
• Sharp tip - curvature radius < 10 nm. • Resonance frequency, specified with high accuracy - ±10% within a wafer. • Special chip geometry with vertical sidewalls for convenient operating. • High aspect ratio tip. • Enhanced back-side reflection of the cantilever. • Cost effective price. General Features
Special Features
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