Super Sharp High Resolution Silicon AFM Cantilevers FMG01_SS series are designed for Force Modulation applications. Typical Resonant Frequency 75 kHz (guaranteed range 45-115kHz), Typical Force Constant 2.8 N/m (guaranteed range 0.5-9.5N/m). Typical tip curvature radius is 2nm.
Using the probes with sharpened tips you will be able to increase resolution of the obtained images especially on objects with typical sizes of several nanometers.
Cantilever has Al reflective side coating to increase laser signal.
Probes are packed in boxes with 10 pieces.
