DRP30_SS

Unique Super Sharp probes with single crystal diamond tip for topography measurements.
The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
Nominal values: force constant - 42 N/m, resonance frequency – 300 kHz.

Upon customers' request the next options are available:
- super sharp probes with typical curvature radius 2nm;
- probes with another lever specification;
- probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.

Cantilever specifications

Geometry:	Rectangular
Material:	Diamond coated Si
Cantilever bending:	< 3°

Bulk tip specifications

Si geometry:	Rotated (Symmetric)
Si tip height (h):	15 ± 2 μm
Front angle:	25 ± 2°
Back angle:	22 ± 2°
Side angle:	18 ± 2°
Tip offset:	10 - 20 μm

Single crystal diamond tip specifications

Geometry:	Cone
Tip radius:	guaranteed <5nm
Tip height (h):	300 nm ± 100 nm
Tilt angle:	0 ± 1°
Tip material:	Single crystal diamond
Cone ½ angle:	15 ± 2°