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DEP30RProduct DescriptionHighly Conductive Long Lasting Sharp Diamond Probes formed by a unique patented process ensure the best possible wear and electrical performance. The tips are sharper and last longer than any other electrical AFM probe. The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm. A sharp tip is formed from a single diamond crystal which yields an unsurpassed combination of resolution, mechanical properties and electrical performance. Contact resistance is between 10k and 100k ohms depending on contact radius measured on a silver coated surface. A gold reflex coating is deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
Upon customers' request the next options are available:
- super sharp probes with typical curvature radius 2nm; - probes with another lever specification; - probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements. Cantilever specifications
Bulk tip specifications
Single crystal diamond tip specifications
General Features
Special Features
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