Probes with Single Crystal Diamond Tip

- Sharp (7nm) conductive single crystal diamond tips for electrical measurement:

    DEP30 (hard conductive noncontact probes): http://tipsnano.com/catalog/afm-special/scd/dep30/  and
    DEP_C (conductive contact probes): http://tipsnano.com/catalog/afm-special/scd/dep-c/  

Highly Conductive Long Lasting Sharp Diamond Probes formed by a unique patented process ensure the best possible wear and electrical performance. These tips with typical curvature radius about 7 nm are sharper and last longer than any other electrical AFM probe.

- Super Sharp (2nm) single crystal diamond tips:

     DRP30_SS: http://tipsnano.com/catalog/afm-special/scd/drp30-ss/

Long Lasting Diamond Probes for topography imaging with typical curvature radius 2nm. These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data on the samples of several nanometer size from your system.

- Probes for Nanoindentation, Nanoscratching, Force Lithography:

    DRP_IN: http://tipsnano.com/catalog/afm-special/scd/drp-in/

Specially designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a board cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and are able to image the indents at high resolution in-situ using the same probe.

- In our product line there are also SCD probes for topography imaging with standard typical curvature radius 7nm (guaranteed < 10 nm)

   DRP30: http://tipsnano.com/catalog/afm-special/scd/dep30/ .

The main probe advantages:

• High Resolution Diamond Tip – typical tip radius 7nm for both topography and electrical measurements, 2 nm super sharp tips.
• Endurance of Diamond - at least 10x Lifetime of Silicon.
• Standard AFM chip size.

The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more. Sharp, single crystal diamond AFM probes give the AFM user all the known benefits of hard diamond, with no compromise on image resolution.

In case of any questions, please, contact us by e-mail: sales@tipsnano.com
or fill in Ask for help form on our page: http://tipsnano.com/help/