Test Samples

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

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DNA01

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

  €150

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6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

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SiC/0.75

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

  €240

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6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

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SiC/1.5

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

  €240

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Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.

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PFM03

Test Pattern for the Piezoresponse Force Microscopy, periodically poled lithium niobate.

  €450

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Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

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PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300

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