High Resolution High Resonant Frequency AFM Cantilevers HA_HR/Au series are designed for Semicontact ( Intermittent ), Noncontact and electrical applications (SKM, SCM, SRIM, EFM, LAO Lithography). Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 380kHz / 230kHz (dispersion ±10%), Typical Force Constant 34N/m / 17N/m (dispersion ±20%). Cantilever has Au tip and reflective side coatings. Probes are also available without tip coating.
Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.
High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:
• Sharp tip - curvature radius < 10 nm.
• Resonance frequency, specified with high accuracy - ±10% within a wafer.
• Special chip geometry with vertical sidewalls for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.
• Cost effective price.
