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AFM Standard

The cantilever is a key element of any scanning probe microscope, the properties and quality of which depends on the successful operation of the microscope in General. This is the basic measuring element of many types of probe microscopes. The right choice of the cantilever is one of the most important conditions for obtaining good AFM images.

The most important component of AFM (Atomic force microscope) are the scanning probes of the cantilevers. The cantilever is a flexible beam (175х40х4 µm — average data) with a certain stiffness coefficient k (10-3 – 10 N/m), which is a micro needle.

TipsNano company offers a wide range of cantilevers for a wide range of applications of scanning probe microscopy and full research samples.

NSG_L

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating

€575

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NSG_L

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating

€575

Аdd to cart

SS_FD_SET/15

SPECIAL OFFER! Mixed Cantilever Set with super sharp and diamond tips: NSG30_SS/5 + NSG01_DLC/5 + HA_NC/FD/5

€1 190

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SS_FD_SET/15

SPECIAL OFFER! Mixed Cantilever Set with super sharp and diamond tips: NSG30_SS/5 + NSG01_DLC/5 + HA_NC/FD/5

€1 190

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MSSET/30

SPECIAL OFFER! Mixed Cantilever Set for contact, semicontact and conductive modes: NSG30/10 + CSG01/10 + FMG01/Pt/10

€845

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MSSET/30

SPECIAL OFFER! Mixed Cantilever Set for contact, semicontact and conductive modes: NSG30/10 + CSG01/10 + FMG01/Pt/10

€845

Аdd to cart

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AFM Standard