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HA_NC/FD
Product Description
The best AFM tips for routine measurements at the reasonable price!
Unique probes with Single Crystal Full Diamond tip for topography measurements.
Nominal values: force constant - 3.5 N/m, resonance frequency – 140 kHz.
Probe highlights:
- The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
- These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
- Diamond tips are less sensitive to static charges on sample’s surface. That results in easy approach and more detailed topography imaging in comparison with Si cantilevers in the same conditions.
- Due to the hydrophobic surface the diamond tip doesn't get dirty while scanning samples (biological etc.).
Diamond tip specifications
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Geometry:
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Cone
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Tip radius:
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< 10nm
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Tip height (h):
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10-15 µm
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Tip material:
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Single crystal diamond
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Cone angle:
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< 25°
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General Features
| Material |
Polysilicon cantilever, full diamond tip |
| Chip size |
3.6x1.6x0.4mm |
| Reflective side coating |
Au |
| Tip coating |
No |
| Tip curvature radius |
< 10nm |
Special Features
| Cantilever series |
Cantilever length, L±2µm |
Cantilever width, W±3µm |
Cantilever thickness, T±0.15µm |
Resonant frequency, kHz |
Force constant, N/m |
| min |
typical |
max |
min |
typical |
max |
| HA_NC/FD |
124 |
34 |
1.85 |
105 |
140 |
175 |
2.5 |
3.5 |
4.5 |
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