more contacts


Set of 10 probes
€750 +
Аdd to cart

Product Description

The best AFM tips for routine measurements at the reasonable price!

Unique probes with Single Crystal Full Diamond tip for topography measurements.
Nominal values: force constant - 3.5 N/m, resonance frequency – 140 kHz.

Probe highlights:

  • The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
  • These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
  • Diamond tips are less sensitive to static charges on sample’s surface. That results in easy approach and more detailed topography imaging in comparison with Si cantilevers in the same conditions.
  • Due to the hydrophobic surface the diamond tip doesn't get dirty while scanning samples (biological etc.). 

Diamond tip specifications



Tip radius:

  < 10nm 

       Tip height (h):      

10-15 µm

Tip material:

 Single crystal diamond    

Cone angle:

< 25°

General Features

Material Polysilicon cantilever, full diamond tip
Chip size 3.6x1.6x0.4mm
Reflective side coating Au
Tip coating No
Tip curvature radius < 10nm

Special Features

Cantilever series Cantilever length, L±2µm Cantilever width, W±3µm Cantilever thickness, T±0.15µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
HA_NC/FD 124 34 1.85 125 140 155 2.5 3.5 4.5

successfully added to cart!

Continue shoppingGo to cart