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Set of 5 probes
€450 €1 125 +
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Product Description

Unique probes with Single Crystal Diamond tip specially designed for Nanoindentation, Nanoscratching, Lithography etc. Resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a board cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and are able to image the indents at high resolution in-situ using the same probe. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

The probes ideally suited to scratch testing and long period probe lifetime applications where quantitative nanomechanics are not essential.

Nominal values: force constant - 350 N/m, resonance frequency – 750 kHz.

Cantilever specifications

Geometry: Rectangular
Material:   Diamond coated Si  
  Cantilever bending:  < 3°

Bulk tip specifications

Si geometry:          4 Sided Pyramid  
   Si tip height (h):          12,5 ± 2,5 μm
Front angle: 25 ± 5°
Back angle: 15 ± 5°
Side angle:    22.5 ± 5°
Tip offset:    15 ± 5 μm

Single crystal diamond tip specifications

Geometry: Cone
Tip radius: 25 ± 5 nm 
       Tip height (h):          500 nm ± 100 nm
Tilt angle: 0 ± 1°
Tip material:    Diamond
Cone ½ angle:    45 ± 10°

General Features

Chip size 3.4x1.6x0.3
Reflective side coating Au
Tip coating Single crystal diamond
Tip curvature radius typical 25nm, guaranteed <35nm

Special Features

Cantilever series Cantilever length, L±10µm Cantilever width, W±5µm Cantilever thickness, T±0.5µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
DPR_In 125 30 4.0 500 750 1000 100 350 600

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