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28.04.2022 New test sample for Piezoresponse Force Microscopy New test sample for Piezoresponse Force Microscopy
Piezoelectric single crystal lead PMN-PT
19.03.2018 Probes with Full Diamond tips Probes with Full Diamond tips
The best AFM tips for both routine and special measurements at the reasonable price!
Full diamond tip with curvature radius less than 10nm.
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VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
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VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
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TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €300
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TGT1 TGT1

Test grating TGT1 for tip shape and sharpness estimation, for image deconvolution and contamination control.

  €300
Аdd to cart
NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
NSG_L NSG_L

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating

  €420
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NSG_L NSG_L

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG_L series, resonant frequency 160-225 kHz, force constant 36-90 N/m, Au reflective coating

  €420
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PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
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PFM_S PFM_S

Test Pattern for the Piezoresponse Force Microscopy, piezoelectric single crystal lead PMN-PT.

  €300
Аdd to cart
NSG30/Pt NSG30/Pt

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.

from €420
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NSG30/Pt NSG30/Pt

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Pt series with PtIr tip and reflective sides coating, resonant frequency 240-440kHz, force constant 22-100N/m.

from €420
Аdd to cart
NSG30 NSG30

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.

from €350
Аdd to cart
NSG30 NSG30

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30 series, resonant frequency 240-440 kHz, force constant 22-100 N/m.

from €350
Аdd to cart
MFM_LM MFM_LM

Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.

  €950
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MFM_LM MFM_LM

Low Moment High resolution long lifetime magnetic probes MFM_LM series for low coercive magnetic samples, resonant frequency 47-90kHz, force constant 1-5N/m.

  €950
Аdd to cart
MFM01 MFM01

High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.

  €690
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MFM01 MFM01

High resolution long lifetime magnetic probes MFM01 series, resonant frequency 47-90kHz, force constant 1-5N/m.

  €690
Аdd to cart
TGL1 TGL1

Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.

  €350
Аdd to cart
TGL1 TGL1

Calibration grating TGL1 for 2-D and 3-D calibration with three periods - 6um,10um, 20um, three structures - lineas, pillars, circles. Step height 168nm.

  €350
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <5nm

  €1 215
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DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <5nm

  €1 215
Аdd to cart
CSG10_SS CSG10_SS

Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart
CSG10_SS CSG10_SS

Super Sharp High Resolution Contact Silicon AFM Cantilevers CSG10_SS series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m, typical tip curvature radius 2nm, Al reflective coating.

  €750
Аdd to cart

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