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30.10.2016 Probes with Single Crystal Diamond Tip Probes with Single Crystal Diamond Tip
Extension of product line - Super Sharp (2nm), Probes for Nanoindentation, probes for Electrical Measurement (7nm). The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
31.07.2016 Cantilevers with Single Crystal Diamond Tip Cantilevers with Single Crystal Diamond Tip
TipsNano Company would like to announce a New Unique product - Probes with Single Crystal Diamond Tip for topography and electrical measurements. The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
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HA_FM/W2C+ HA_FM/W2C+

High Resolution High Accuracy Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with W2C+ tip conductive coating for long time work in electrical AFM modes, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.

from €300 €255
Аdd to cart
HA_FM/W2C+ HA_FM/W2C+

High Resolution High Accuracy Semicontact / Noncontact / Force Modulation AFM Cantilevers HA_FM series with W2C+ tip conductive coating for long time work in electrical AFM modes, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.

from €300 €255
Аdd to cart
NSG10/TiN NSG10/TiN

NEW! High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG10/TiN series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m. Al reflective coating.

from €400 €340
Аdd to cart
NSG10/TiN NSG10/TiN

NEW! High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG10/TiN series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m. Al reflective coating.

from €400 €340
Аdd to cart
HA_NC HA_NC

High Resolution High Accuracy Semicontact / Noncontact AFM Cantilevers HA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.

from €260 €221
Аdd to cart
HA_NC HA_NC

High Resolution High Accuracy Semicontact / Noncontact AFM Cantilevers HA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.

from €260 €221
Аdd to cart
VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m.

from €405
Аdd to cart
VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m.

from €405
Аdd to cart
NSG10 NSG10

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG10 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.

from €300 €255
Аdd to cart
NSG10 NSG10

High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG10 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.

from €300 €255
Аdd to cart
DEP30 DEP30

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP30 DEP30

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP_C DEP_C

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for contact electrical AFM modes, resonant frequency 20-40kHz, force constant 0.2-0.9 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP_C DEP_C

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for contact electrical AFM modes, resonant frequency 20-40kHz, force constant 0.2-0.9 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP30H DEP30H

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 300-400kHz, force constant 60-100 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP30H DEP30H

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 300-400kHz, force constant 60-100 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP01 DEP01

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.

  €900
Аdd to cart
DEP01 DEP01

Highly Conductive Long Lasting Sharp Single Crystal Diamond Probes for electrical AFM modes, resonant frequency 60-125kHz, force constant 1.2-4.5 N/m, curvature radius <10nm.

  €900
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).

  €1,350
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).

  €1,350
Аdd to cart
DRP30 DRP30

Long Lasting Sharp Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.

  €500
Аdd to cart
DRP30 DRP30

Long Lasting Sharp Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, curvature radius <10nm.

  €500
Аdd to cart
MF002 MF002

SNOM fiber probes with transmitted wavelength 450-600nm without tuning forks, basic Nufern fiber 460-HP, fiber diameter 125 um, fiber length 2m, aperture 100 ± 30 nm.

  €1,190
Аdd to cart
MF002 MF002

SNOM fiber probes with transmitted wavelength 450-600nm without tuning forks, basic Nufern fiber 460-HP, fiber diameter 125 um, fiber length 2m, aperture 100 ± 30 nm.

  €1,190
Аdd to cart

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