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Set of 15 probes
€260 +
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Set of 50 probes
€750 +
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Set of 100 probes
€1,200 +
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Product Description

Tipless High Accuracy AFM Cantilevers HA_C series are designed for Contact mode and Lateral Force Mode applications. Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 37kHz / 19kHz (dispersion ±10%). Typical Force Constant 0.65N/m / 0.26N/m (dispersion ±20%). Cantilever has Au reflective side coating to increase laser signal.

Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

Tipless High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:

• Resonance frequency, specified with high accuracy - ±10% within a wafer.
• Special chip geometry with vertical sidewalls for convenient operating.
• Enhanced back-side reflection of the cantilever.
• Cost effective price.

General Features

Material Polysilicon cantilever
Chip size 3.6x1.6x0.4mm
Reflective side coating Au

Special Features

Cantilever series Cantilever Cantilever length, L±2µm Cantilever width, W±3µm Cantilever thickness, T±0.15µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
HA_C/tipless A 264 34 1.85 33 37 42 0.5 0.65 0.8
B 364 34 1.85 16 19 22 0.2 0.26 0.32

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