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SNOM_NC
SNOM aperture cantilevers for NONCONTACT mode, resonance frequency 88-180 kHz, force constant 5.9-39 N/m.
  $3,520
SNOM_NC
SNOM aperture cantilevers for NONCONTACT mode, resonance frequency 88-180 kHz, force constant 5.9-39 N/m.
  $3,520
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
  $825
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.
  $825
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
  $825
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.
  $825
ZYA_DS, 10x10x2mm
HOPG ZYA Quality, Mosaic Spread: 0.4 ± 0.1 degrees, double-sided, piece size – 10x10mm, thickness 2mm.
  $443.30
ZYA_DS, 10x10x2mm
HOPG ZYA Quality, Mosaic Spread: 0.4 ± 0.1 degrees, double-sided, piece size – 10x10mm, thickness 2mm.
  $443.30
NSG30/Au
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Au series, resonant frequency 240-440kHz, force constant 22-100N/m.
  $1,408
NSG30/Au
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Au series, resonant frequency 240-440kHz, force constant 22-100N/m.
  $1,408
SNOM_C
SNOM aperture cantilevers for CONTACT mode, resonance frequency 15-27 kHz, force constant 0.4-2.3 N/m.
  $3,520
SNOM_C
SNOM aperture cantilevers for CONTACT mode, resonance frequency 15-27 kHz, force constant 0.4-2.3 N/m.
  $3,520
CSG30
High Resolution Contact Silicon AFM Cantilevers CSG30 series, resonant frequency 26-76kHz, force constant 0,13-2N/m.
  $1,045
CSG30
High Resolution Contact Silicon AFM Cantilevers CSG30 series, resonant frequency 26-76kHz, force constant 0,13-2N/m.
  $1,045
MF113_NTF
SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 125±25 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 600-770 nm.
  $3,850
MF113_NTF
SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 125±25 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 600-770 nm.
  $3,850
SU001
Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.
  $262.90
SU001
Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.
  $262.90
TGS1_PTB
Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
  $990
TGS1_PTB
Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
  $990
MF112_NTF
SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 100 ± 30nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 450-600 nm.
  $3,850
MF112_NTF
SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 100 ± 30nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 450-600 nm.
  $3,850
TGSFull+
Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
  $1,430
TGSFull+
Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
  $1,430
TGS1F
Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm, 1517±20nm.
  $330
TGS1F
Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm, 1517±20nm.
  $330
TGSFull
Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
  $1,265
TGSFull
Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
  $1,265
DNA01
DNA test sample - long-lifetime, stable and non-destructing object for AFM.
  $165
DNA01
DNA test sample - long-lifetime, stable and non-destructing object for AFM.
  $165
NSG10/Au
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG10/Au series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.
  $1,408
NSG10/Au
High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG10/Au series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.
  $1,408
TGS2
Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
  $990
TGS2
Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
  $990
TGS1
Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
  $275
TGS1
Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm, 520±3nm.
  $275
MF003
SNOM fiber probes with transmitted wavelength 600-770nm without tuning forks, basic Nufern fiber 630-HP, fiber diameter 125 um, fiber length 2m, aperture 125 ± 25nm.
  $2,310
MF003
SNOM fiber probes with transmitted wavelength 600-770nm without tuning forks, basic Nufern fiber 630-HP, fiber diameter 125 um, fiber length 2m, aperture 125 ± 25nm.
  $2,310
SiC/0.75
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.
  $264
SiC/0.75
6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.
  $264
CSG01/Pt
High Resolution Contact Conductive Silicon AFM Cantilevers CSG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.
  $1,408
CSG01/Pt
High Resolution Contact Conductive Silicon AFM Cantilevers CSG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.
  $1,408
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