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MFM10
MFM10 MFM10 MFM10

MFM10

MFM10/15
Set of 15 cantilevers
€600 +
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Product Description

High Resolution Silicon AFM Cantilevers MFM10 and MFM01 series.are specially designed for work in magnetic AFM mode (MFM).
Due to optimized coating thickness these probes suit for different magnetic samples and are recommended for initial measurements of new samples. Upon reviewing the results you can take a decision if the MFM coating used is the appropriate one or it is better to try another type of magnetic coating.
Due to special defensive layers which prevent the ferromagnetic tip coating from oxidizing, all MFM probes have a long shelf life, and the small tip curvature radius enables you to obtain good high resolution images.
Typical Resonant Frequency of the probes 150 kHz (guaranteed range 87-230kHz), typical Force Constant 5.1 N/m (guaranteed range 1.45-15.1N/m). Cantilever has Al reflective side coating to increase laser signal.
Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

General Features

Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side coating Al
Tip coating CoCr
Tip curvature radius ~ 40nm

Special Features

Cantilever series Cantilever length, L±10µm Cantilever width, W±5µm Cantilever thickness, T±0.5µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
MFM10 125 30 2.0 87 150 230 1.45 5.1 15.1
 

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