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Set of 15 probes
€495 +
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Set of 50 probes
€1,380 +
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Product Description

High Resolution High Resonant Frequency AFM Cantilevers HA_FM series are designed for Magnetic, Semicontact ( Intermittent ), Noncontact applications. Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 114kHz / 77kHz (dispersion ±10%). Typical Force Constant 12N/m / 3.5N/m (dispersion ±20%). Cantilever has Au reflective and CoFe tip side coatings. Probes are also available without tip coating.

Guaranteed lifetime is within 3 months.

Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:
• Sharp tip - curvature radius < 35 nm for coated probes.
• Resonance frequency, specified with high accuracy - ±10% within a wafer.
• Special chip geometry with vertical sidewalls for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.
• Cost effective price.

General Features

Material Polysilicon cantilever, silicon tip
Chip size 3.6x1.6x0.4mm
Reflective side coating Au
Tip coating Co
Tip curvature radius < 35nm
Available tip coatings Au, W2C, Pt

Special Features

Cantilever series Cantilever Cantilever length, L±2µm Cantilever width, W±3µm Cantilever thickness, T±0.15µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
HA_FM/Co A 183 34 3.0 100 114 130 4.5 6 7.5
B 223 34 3.0 60 77 95 2.5 3.5 4.5

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