HA_FM/CoFe

High Resolution High Resonant Frequency AFM Cantilevers HA_FM series are designed for Magnetic, Semicontact ( Intermittent ), Noncontact applications. Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 114kHz / 77kHz (dispersion ±10%). Typical Force Constant 12N/m / 3.5N/m (dispersion ±20%). Cantilever has Au reflective and CoFe tip side coatings. Probes are also available without tip coating.

Guaranteed lifetime is within 3 months.

Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:
• Sharp tip - curvature radius < 35 nm for coated probes.
• Resonance frequency, specified with high accuracy - ±10% within a wafer.
• Special chip geometry with vertical sidewalls for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.
• Cost effective price.