High Aspect Ratio Premium Etalon tips PHA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m, with Au reflective coating.
Premium ETALON tips have conical apex and cylindrical body to minimize tip-related widening of objects investigated. Excellent geometry provides high resolution of AFM scans:
- Conical apex of 5-8 nm typical curvature radius and cone angle < 30° suits well for imaging of small objects and nanoparticles;
- Narrow cylindrical body with diameter of 300 - 700 nm allows getting detailed images of high objects, making Etalon Premium probes being similar to high aspect ratio probes’ models.
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High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:
• Sharp tip - curvature radius < 10 nm.
• Resonance frequency, specified with high accuracy - ±10% within a wafer.
• Special chip geometry with vertical sidewalls for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.
• Cost effective price.
Specification of PHA_NC probe series:
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Material
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Polysilicon lever,
monocrystal silicon tip
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Chip size
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3.6 x 1.6 x 0.4 mm
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Reflective side
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Au
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Cantilever number
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2 rectangular
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Tip shape
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Cylindrical at the base, conic on the last 1000 nm
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Tip cone angle φ
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30 degrees on the last 1000nm
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Full tip height
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≥ 8 µm
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Pedestal/tip ratio
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1:1
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Tip curvature radius
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less than 10nm (5-8 nm typically)
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