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AFM Special

The cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface.

NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €600
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NSG30_SS NSG30_SS

Super Sharp High Resolution Semicontact / Noncontact Silicon AFM Cantilevers NSG30_SS series, resonant frequency 240-440 kHz, force constant 22-100 N/m, typical curvature radius 2nm, Al reflective coating.

  €600
Аdd to cart
DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).

  €1,215
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DRP30_SS DRP30_SS

Super Sharp Long Lasting Single Crystal Diamond Probes for noncontact/semicontact modes, resonant frequency 140-220kHz, force constant 20-60 N/m, typical curvature radius 2nm (guaranteed <5nm).

  €1,215
Аdd to cart

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