sales@tipsnano.com
more contacts

Select by:

Cantilever series
All
Material
All
Chip size
All
Reflective side coating
All
Cantilever’s quantity
All
Tip coating
All
Tip curvature radius
All
Available tip coatings
All
Cantilever length, L± µm
Cantilever width, W± µm
Cantilever thickness, T± µm
Resonant frequency, kHz
Force constant, N/m
 
Selected: 0
Show
 

AFM Special

The cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface.

DRP_In DRP_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.

  €1,125 €675
Аdd to cart
DRP_In DRP_In

Single Crystal Diamond Probes specially designed for Nanoindentation, Nanoscratching, Lithography, resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 25nm.

  €1,125 €675
Аdd to cart

Pages: Prev. 1 2
 

successfully added to cart!

Continue shoppingGo to cart