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AFM Special

The cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface.

VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
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VIT_P VIT_P

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series, uncoated, resonant frequency 210-490 kHz, force constant 12-110 N/m.

from €565
Аdd to cart

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