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Cantilever length, L± µm
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Cantilever thickness, T± µm
Resonant frequency, kHz
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SNOM_NC SNOM_NC

SNOM aperture cantilevers for NONCONTACT mode, resonance frequency 88-180 kHz, force constant 5.9-39 N/m.

  €3 200
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SNOM_NC SNOM_NC

SNOM aperture cantilevers for NONCONTACT mode, resonance frequency 88-180 kHz, force constant 5.9-39 N/m.

  €3 200
Аdd to cart
NSG10_DLC NSG10_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.

  €750
Аdd to cart
NSG10_DLC NSG10_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10, resonance frequency 255 kHz, force constant 11.5 N/m.

  €750
Аdd to cart
NSG01_DLC NSG01_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.

  €750
Аdd to cart
NSG01_DLC NSG01_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01, resonance frequency 150 kHz, force constant 5.5 N/m.

  €750
Аdd to cart
ZYA_DS, 10x10x2mm ZYA_DS, 10x10x2mm

HOPG ZYA Quality, Mosaic Spread: 0.4 ± 0.1 degrees, double-sided, piece size – 10x10mm, thickness 2mm.

  €403
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ZYA_DS, 10x10x2mm ZYA_DS, 10x10x2mm

HOPG ZYA Quality, Mosaic Spread: 0.4 ± 0.1 degrees, double-sided, piece size – 10x10mm, thickness 2mm.

  €403
Аdd to cart
NSG30/Au NSG30/Au

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Au series, resonant frequency 240-440kHz, force constant 22-100N/m.

  €1 280
Аdd to cart
NSG30/Au NSG30/Au

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG30/Au series, resonant frequency 240-440kHz, force constant 22-100N/m.

  €1 280
Аdd to cart
SNOM_C SNOM_C

SNOM aperture cantilevers for CONTACT mode, resonance frequency 15-27 kHz, force constant 0.4-2.3 N/m.

  €3 200
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SNOM_C SNOM_C

SNOM aperture cantilevers for CONTACT mode, resonance frequency 15-27 kHz, force constant 0.4-2.3 N/m.

  €3 200
Аdd to cart
CSG30 CSG30

High Resolution Contact Silicon AFM Cantilevers CSG30 series, resonant frequency 26-76kHz, force constant 0,13-2N/m.

  €950
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CSG30 CSG30

High Resolution Contact Silicon AFM Cantilevers CSG30 series, resonant frequency 26-76kHz, force constant 0,13-2N/m.

  €950
Аdd to cart
MF113_NTF MF113_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 125±25 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 600-770 nm.

  €3 500
Аdd to cart
MF113_NTF MF113_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 125±25 nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 600-770 nm.

  €3 500
Аdd to cart
Mica/d9.5 Mica/d9.5

Mica Disks, 0.15 mm (0.006")  thickness,  size  9.5 mm diameter.

  €150
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Mica/d9.5 Mica/d9.5

Mica Disks, 0.15 mm (0.006")  thickness,  size  9.5 mm diameter.

  €150
Аdd to cart
SU001 SU001

Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.

  €239
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SU001 SU001

Set of 10 substrates of polycrystalline sapphire. Size 24x19,3x0,5mm.

  €239
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Mica/15x15 Mica/15x15

Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm.

  €150
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Mica/15x15 Mica/15x15

Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm.

  €150
Аdd to cart
TGS1_PTB TGS1_PTB

Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €900
Аdd to cart
TGS1_PTB TGS1_PTB

Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €900
Аdd to cart
MF112_NTF MF112_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 100 ± 30nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 450-600 nm.

  €3 500
Аdd to cart
MF112_NTF MF112_NTF

SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems, aperture 100 ± 30nm, fiber diameter 125um, probe length 2m, probe tip coated by Al - 7-8mm, transmitted wavelength 450-600 nm.

  €3 500
Аdd to cart
TGSFull+ TGSFull+

Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 300
Аdd to cart
TGSFull+ TGSFull+

Full set of calibration standards for AFM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 300
Аdd to cart
TGS1F TGS1F

Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm, 1517±20nm.

  €300
Аdd to cart
TGS1F TGS1F

Set of 4 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm, 1517±20nm.

  €300
Аdd to cart
TGSFull TGSFull

Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 150
Аdd to cart
TGSFull TGSFull

Set of calibration standards for AFM lateral and vertical calibration (including simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €1 150
Аdd to cart
DNA01 DNA01

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

  €150
Аdd to cart
DNA01 DNA01

DNA test sample - long-lifetime, stable and non-destructing object for AFM.

  €150
Аdd to cart
NSG10/Au NSG10/Au

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG10/Au series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.

  €1 280
Аdd to cart
NSG10/Au NSG10/Au

High Resolution Noncontact Conductive Silicon AFM Cantilevers NSG10/Au series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.

  €1 280
Аdd to cart
TGS2 TGS2

Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €900
Аdd to cart
TGS2 TGS2

Set of 6 calibration gratings for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

  €900
Аdd to cart
TGS1 TGS1

Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €250
Аdd to cart
TGS1 TGS1

Set of 3 calibration gratings for AFM lateral and vertical calibration, detection of lateral non-linearity. Calibration grating set TGS1 for Z and X (or Y) calibration. Step heights: 20±1.5nm, 110±2nm,  520±3nm.

  €250
Аdd to cart
MF003 MF003

SNOM fiber probes with transmitted wavelength 600-770nm without tuning forks, basic Nufern fiber 630-HP, fiber diameter 125 um, fiber length 2m, aperture 125 ± 25nm.

  €2 100
Аdd to cart
MF003 MF003

SNOM fiber probes with transmitted wavelength 600-770nm without tuning forks, basic Nufern fiber 630-HP, fiber diameter 125 um, fiber length 2m, aperture 125 ± 25nm.

  €2 100
Аdd to cart
SiC/0.75 SiC/0.75

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

  €240
Аdd to cart
SiC/0.75 SiC/0.75

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in subnanometer intervals.

  €240
Аdd to cart
CSG01/Pt CSG01/Pt

High Resolution Contact Conductive Silicon AFM Cantilevers CSG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.

  €1 280
Аdd to cart
CSG01/Pt CSG01/Pt

High Resolution Contact Conductive Silicon AFM Cantilevers CSG01/Pt series with PtIr tip and reflective sides coating, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.

  €1 280
Аdd to cart
SiC/1.5 SiC/1.5

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

  €240
Аdd to cart
SiC/1.5 SiC/1.5

6H-SiC(0001) based calibration sample for Z-axis AFM scanner calibration in several nanometer intervals.

  €240
Аdd to cart

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