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HA_NC
HA_NC HA_NC HA_NC HA_NC HA_NC HA_NC HA_NC

HA_NC

HA_NC/15
Set of 15 cantilevers
$304 +
Аdd to cart
HA_NC/50
Set of 50 cantilevers
$878 +
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HA_NC/100
Set of 100 cantilevers
$1,404 +
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HA_NC/200
Set of 200 cantilevers
$2,633 +
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Product Description

High Resolution High Accuracy AFM Cantilevers HA_NC series are designed for Semicontact ( Intermittent ), Noncontact applications. Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 235kHz / 140kHz (dispersion ±10%). Typical Force Constant 12N/m / 3.5N/m (dispersion ±20%). Cantilever has Au reflective side coating to increase laser signal. Probes are also available with no coating as well as with conductive tip coating.

Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.

High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:
• Sharp tip - curvature radius < 10 nm.
• Resonance frequency, specified with high accuracy - ±10% within a wafer.
• Special chip geometry with vertical sidewalls for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.
• Cost effective price.

General Features

Material Polysilicon cantilever, silicon tip
Chip size 3.6x1.6x0.4mm
Reflective side coating Au
Tip coating No
Tip curvature radius < 10nm
Available tip coatings Pt, Au, W2C

Special Features

Cantilever series Cantilever Cantilever length, L±2µm Cantilever width, W±3µm Cantilever thickness, T±0.15µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
HA_NC A 94 34 1.85 210 235 260 9 12 15
B 124 34 1.85 125 140 155 2.5 3.5 4.5
 

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