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Set of 10 probes
€500 +
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Product Description

Unique probes with single crystal diamond tip for topography measurements.
The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
Nominal values: force constant - 40 N/m, resonance frequency – 180 kHz.

Upon customers' request the next options are available:
- super sharp probes with typical curvature radius 2nm;
- probes with another lever specification;
- probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.

Cantilever specifications

Geometry: Rectangular
Material:   Diamond coated Si  
  Cantilever bending:  < 3°

Bulk tip specifications

Si geometry:   Rotated (Symmetric) 
   Si tip height (h):          15 ± 2 μm
Front angle: 25 ± 2°
Back angle:    22 ± 2°
Side angle: 18 ± 2°
Tip offset:    10 - 20 μm

Single crystal diamond tip specifications

Geometry: Cone
Tip radius:   Typical 7nm, guaranteed <10nm 
       Tip height (h):       300 nm ± 100 nm
Tilt angle: 0 ± 1°
Tip material: Single crystal diamond
Cone ½ angle: 15 ± 2°

General Features

Chip size 3.4x1.6x0.3
Reflective side coating Au
Tip coating Single crystal diamond
Tip curvature radius typical 7nm, guaranteed <10nm

Special Features

Cantilever series Cantilever length, L±10µm Cantilever width, W±5µm Cantilever thickness, T±1.0µm Resonant frequency, kHz Force constant, N/m
min typical max min typical max
DPR30 225 28 3.0 140 180 220 20 40 60

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